Very high resolution chemical imaging with Infrared Scanning Near-field Optical Microscopy (IR-SNOM)

  • Dušan Vobornik Institut de Physique de la Matière Complexe, Ecole Polytechnique Fédérale
  • Giorgio Margaritondo Institut de Physique de la Matière Complexe, Ecole Polytechnique Fédérale
  • Slavenka Vobornik Optical Sciences Division, U.S. Naval Research Laboratory
  • Peter Thielen Istituto di stuttura della Materia
  • Renato Generosi Istituto di stuttura della Materia
  • Norman Tolk Department of Physics and Astronomy
  • Antononio Cricenti Department of Physics and Astronomy, Vanderbilt University
Keywords: high resolution, chemical imaging, infrared scanning, near-field optical microscopy, IR-SNOM

Abstract

In this paper we present chemically highly resolved images obtained with Scanning Near-field Optical Microscopy (SNOM) coupled with an Infrared (IR) Free Electron Laser (FEL) at Vanderbilt University, Nashville, USA. Main principles governing SNOM imaging as well as essential components of the experimental setup are described. Chemically resolved images showing the distribution of different phases within the boron-nitride films are presented. Universal character of the experiment and its huge potential applications in biophysics and medical sciences domain are illustrated with highly resolved SNOM images of pancreatic cells.

Downloads

Download data is not yet available.
Very high resolution chemical imaging with Infrared Scanning Near-field Optical Microscopy (IR-SNOM)
Published
2004-05-20
How to Cite
1.
Vobornik D, Margaritondo G, Vobornik S, Thielen P, Generosi R, Tolk N, Cricenti A. Very high resolution chemical imaging with Infrared Scanning Near-field Optical Microscopy (IR-SNOM). Bosn J of Basic Med Sci [Internet]. 2004May20 [cited 2021Dec.6];4(2):17-1. Available from: https://www.bjbms.org/ojs/index.php/bjbms/article/view/3407
Section
New and Emerging Methods